تصنيع مرآة متعددة الطبقات ذات انعكاسية عالية للأشعة تحت الحمراء القريبة

الملخص EN

The spectral reflectivity of a deposited multilayer with variable refractive indices of thin films ( TiO2 / MgF2) was studied .

The layers were deposited by electron beam evaporation technique under a pressure of (4 × 10-6 mbar) .

The experimental measurements showed that by increasing the number of deposited layers of ( TiO2 / MgF2 ) , the reflectivity was increased.

The reflectivity was found to be (98%) at the wavelength of (1.2μm), where many application using this wavelength are deployed.