Dynamic CMOS Load Balancing and Path Oriented in Time Optimization Algorithms to Minimize Delay Uncertainties from Process Variations

المؤلفون المشاركون

Yelamarthi, Kumar
Chen, Chien-In Henry

المصدر

VLSI Design

العدد

المجلد 2010، العدد 2010 (31 ديسمبر/كانون الأول 2010)، ص ص. 1-13، 13ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2010-03-07

دولة النشر

مصر

عدد الصفحات

13

التخصصات الرئيسية

العلوم الهندسية و تكنولوجيا المعلومات

الملخص EN

The complexity of timing optimization of high-performance circuits has been increasing rapidly in proportion to the shrinking CMOS device size and rising magnitude of process variations.

Addressing these significant challenges, this paper presents a timing optimization algorithm for CMOS dynamic logic and a Path Oriented IN Time (POINT) optimization flow for mixed-static-dynamic CMOS logic, where a design is partitioned into static and dynamic circuits.

Implemented on a 64-b adder and International Symposium on Circuits and Systems (ISCAS) benchmark circuits, the POINT optimization algorithm has shown an average improvement in delay by 38% and delay uncertainty from process variations by 35% in comparison with a state-of-the-art commercial optimization tool.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Yelamarthi, Kumar& Chen, Chien-In Henry. 2010. Dynamic CMOS Load Balancing and Path Oriented in Time Optimization Algorithms to Minimize Delay Uncertainties from Process Variations. VLSI Design،Vol. 2010, no. 2010, pp.1-13.
https://search.emarefa.net/detail/BIM-455728

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Yelamarthi, Kumar& Chen, Chien-In Henry. Dynamic CMOS Load Balancing and Path Oriented in Time Optimization Algorithms to Minimize Delay Uncertainties from Process Variations. VLSI Design No. 2010 (2010), pp.1-13.
https://search.emarefa.net/detail/BIM-455728

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Yelamarthi, Kumar& Chen, Chien-In Henry. Dynamic CMOS Load Balancing and Path Oriented in Time Optimization Algorithms to Minimize Delay Uncertainties from Process Variations. VLSI Design. 2010. Vol. 2010, no. 2010, pp.1-13.
https://search.emarefa.net/detail/BIM-455728

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-455728