Study the effect of (x)‎ variation in the zn1-xcdxs thin films on the structure properties

Abstract EN

The Zn1-xCdxS alloys was prepared in evacuated quarts tubes by the method of melt quenching from element, the Zn1-xCdxS thin films prepared by thermal evaporation method and at different value of x (x = 0.1, 0.2, 0.3, 0.4 and 0.5).

X-Ray diffraction technique was used to study the structure of this films and the effect of x value on it.

X-ray diffraction analysis confirmed that these films are crystalline structure nature having faced centered cubic (f.

c.

c.), and lattice parameters are reported.

The preferential orientation is along [111] direction for all deposited films together.

The lattice parameter, grain size, microstrain, dislocation density in the film are calculated and correlated with x.