Height and feature parameters study of thermally evaporated ZnS thin films by AFM

Abstract EN

AFM has allowed to get microscopic information on the surface structure and to plot topographies representing the surface relief.

In this work, this technique was used to visualize the surface relief, specify the growth, and determine Height parameters for form removed thermally evaporated Zinc Sulphide thin films such as root mean square height, Surface Skewness, Surface Kurtosis, Arithmetical mean height, Density of peaks and others.

It can be seen on optical micrographs the fine grains with different sizes which are distributed over a smooth homogeneous background that may correspond to the amorphous, or polycrystalline phase of ZnS film.

Some of the grains are seen to be united / fused-forming agglomerates.

The surface roughness parameters were determined by using the software of ISO 25178 standard provided with the microscope.