Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging
Joint Authors
Gan, C. L.
Ng, E. K.
Chan, B. L.
Classe, F. C.
Hashim, U.
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-7, 7 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-10-02
Country of Publication
Egypt
No. of Pages
7
Main Subjects
Abstract EN
Bondpad cratering, Cu ball bond interface corrosion, IMD (intermetal dielectric) cracking, and uncontrolled post-wirebond staging are the key technical barriers in Cu wire development.
This paper discusses the UHAST (unbiased HAST) reliability performance of Cu wire used in fine-pitch BGA package.
In-depth failure analysis has been carried out to identify the failure mechanism under various assembly conditions.
Obviously green mold compound, low-halogen substrate, optimized Cu bonding parameters, assembly staging time after wirebonding, and anneal baking after wirebonding are key success factors for Cu wire development in nanoelectronic packaging.
Failure mechanisms of Cu ball bonds after UHAST test and CuAl IMC failure characteristics have been proposed and discussed in this paper.
American Psychological Association (APA)
Gan, C. L.& Ng, E. K.& Chan, B. L.& Hashim, U.& Classe, F. C.. 2012. Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-1029148
Modern Language Association (MLA)
Gan, C. L.…[et al.]. Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging. Journal of Nanomaterials No. 2012 (2012), pp.1-7.
https://search.emarefa.net/detail/BIM-1029148
American Medical Association (AMA)
Gan, C. L.& Ng, E. K.& Chan, B. L.& Hashim, U.& Classe, F. C.. Technical Barriers and Development of Cu Wirebonding in Nanoelectronics Device Packaging. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-1029148
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1029148