Formation of Three-Way Scanning Electron Microscope Moiré on MicroNanostructures

Abstract EN

Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM.

The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the periodic cells are arranged in a triangular manner.

The deformation and the structure information of the specimen grating in three directions can be simultaneously obtained from the three-way SEM moiré.

The design considerations of the three-way EB were discussed.

As an illustration, the three-way SEM moiré spots produced on a silicon slide were presented.

The proposed three-way SEM moiré method is expected to characterize micro/nanostructures in triangular or hexagonal arrangements in three directions at the same time.