دراسة تأثير التشويب بالفضة (Ag)‎ على الخصائص التركيبية و البصرية لأغشية (Bi2O3)‎ الرقيقة المحضرة بطريقة التبخير الحراري بالفراغ

Abstract EN

In the present work, the bismuth Oxide (Bi_2 O_3) thin films which have been prepared by thermal oxidation with thicknesses (500±20) nm on glass substrates, X-Ray diffraction result show a polycrystalline in nature with tetragonal crystal structure with predominant orientation [220] with intensity 100, the crystalline size increase after doping these values(34.61-35.19)nm for pure and doping silver with ratio (3% )thin films respectively, (UV-VIS) spectrophotometer discover the high values transparency (85% ) at wavelength(660nm) in visible light for pure films, the direct allowed band gap, and the energy band gap of these films were found to be in the range of (2.75, 2.65)eV for pure and doping silver with ratio (3% )thin films respectively.