Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF
Joint Authors
Lopes, Fabio
Cardozo Amorin, Luís Henrique
da Silva Martins, Larissa
Urbano, Alexandre
Roberto Appoloni, Carlos
Cesareo, Roberto
Source
Issue
Vol. 2016, Issue 2016 (31 Dec. 2016), pp.1-7, 7 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2016-01-24
Country of Publication
Egypt
No. of Pages
7
Main Subjects
Abstract EN
Nanometric thin films have always been chiefly used for decoration; however they are now being widely used as the basis of high technology.
Among the various physical qualities that characterize them, the thickness strongly influences their properties.
Thus, a new procedure is hereby proposed and developed for determining the thickness of V2O5 nanometric thin films deposited on the glass surface using Portable X-Ray Fluorescence (PXRF) equipment and the attenuation of the radiation intensity Kα of calcium present in the glass.
It is shown through the present paper that the radiation intensity of calcium Kα rays is proportional to film thickness in nanometric films of vanadium deposited on the glass surface.
American Psychological Association (APA)
Lopes, Fabio& Cardozo Amorin, Luís Henrique& da Silva Martins, Larissa& Urbano, Alexandre& Roberto Appoloni, Carlos& Cesareo, Roberto. 2016. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Journal of Spectroscopy،Vol. 2016, no. 2016, pp.1-7.
https://search.emarefa.net/detail/BIM-1110813
Modern Language Association (MLA)
Lopes, Fabio…[et al.]. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Journal of Spectroscopy No. 2016 (2016), pp.1-7.
https://search.emarefa.net/detail/BIM-1110813
American Medical Association (AMA)
Lopes, Fabio& Cardozo Amorin, Luís Henrique& da Silva Martins, Larissa& Urbano, Alexandre& Roberto Appoloni, Carlos& Cesareo, Roberto. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Journal of Spectroscopy. 2016. Vol. 2016, no. 2016, pp.1-7.
https://search.emarefa.net/detail/BIM-1110813
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1110813