The derivation of crystal orientation matrix for triclinic system on two-circle diffractometer

Abstract EN

The limited availability of the two-circle diffractometer to collect intensity measurements down to the monoclinic system has been extended in a novel procedure to collect intensities for the triclinic system.

The procedure involves the derivation of matrix elements from graphical representation of the reciprocal lattice.

Offset of the origins of the upper layers from that of the zero-layer - characteristic of triclinic system-is determined and the 3 x 3 matrix elements are evaluated accordingly.

Details of crystal alignment by X-rays for the triclinic system utilizing the intensities of equivalent reflections is described.