Dielectric Relaxation and Hopping Conduction in La2NiO4+δ
Author
Source
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-02-20
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Materials Science , Minerals
Civil Engineering
Abstract EN
An ac conductivity as well as dielectric relaxation property of La2NiO4.1 is reported in the temperature range of 77 K–130 K and in the frequency range of 20 Hz–1 MHz.
Complex impedance plane plots show that the relaxation (conduction) mechanism in this material is purely a bulk effect arising from the semiconductive grain.
The relaxation mechanism has been discussed in the frame of electric modulus spectra.
The scaling behavior of the modulus suggests that the relaxation mechanism describes the same mechanism at various temperatures.
The logarithmic angular frequency dependence of the loss peak is found to obey the Arrhenius law with the activation energy of ~0.09 eV.
The frequency-dependent electrical data are also analyzed in the frame of ac conductivity formalism.
The ac conductivity has been found to follow a power-law behavior at a limited temperature and frequency region where Anderson localization plays a significant role in the transport mechanism for La2NiO4.1.
American Psychological Association (APA)
Jung, Woo-Hwan. 2013. Dielectric Relaxation and Hopping Conduction in La2NiO4+δ. Journal of Materials،Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-451420
Modern Language Association (MLA)
Jung, Woo-Hwan. Dielectric Relaxation and Hopping Conduction in La2NiO4+δ. Journal of Materials No. 2013 (2013), pp.1-6.
https://search.emarefa.net/detail/BIM-451420
American Medical Association (AMA)
Jung, Woo-Hwan. Dielectric Relaxation and Hopping Conduction in La2NiO4+δ. Journal of Materials. 2013. Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-451420
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-451420