Conformity Check of Thickness to the Crystal Plate λ4(λ2)
Joint Authors
Krishtop, Victor
Syuy, Alexander
Shtarev, Dmitriy
Kireeva, Natalia
Source
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-4, 4 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-12-29
Country of Publication
Egypt
No. of Pages
4
Main Subjects
Abstract EN
This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero.
This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates of λ/4 or λ/2) and the examined plate by the intensity of the transmitted radiation.
Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes.
The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.
American Psychological Association (APA)
Syuy, Alexander& Shtarev, Dmitriy& Krishtop, Victor& Kireeva, Natalia. 2013. Conformity Check of Thickness to the Crystal Plate λ4(λ2). Journal of Spectroscopy،Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-505421
Modern Language Association (MLA)
Syuy, Alexander…[et al.]. Conformity Check of Thickness to the Crystal Plate λ4(λ2). Journal of Spectroscopy No. 2013 (2013), pp.1-4.
https://search.emarefa.net/detail/BIM-505421
American Medical Association (AMA)
Syuy, Alexander& Shtarev, Dmitriy& Krishtop, Victor& Kireeva, Natalia. Conformity Check of Thickness to the Crystal Plate λ4(λ2). Journal of Spectroscopy. 2013. Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-505421
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-505421