Thickness effect of CuAlTe2 thin films on morphological, structural and visual properties

Abstract EN

CuAlTe2 thin films were evaporation on glass substrates using the technique of thermal evaporation at different range of thickness (200, 300, 400and500) ±2nm.

The structures of these films were investigated by X-ray diffraction method; showing that films possess a good crystalline in tetragonal structure.

AFM showed that the grain size increased from (70.

55-99.

40) nm and the roughness increased from (2.

08-3.

65) nm by increasing the thickness from (200-500) nm.

The optical properties measurements, such as orbance, transmtance, reflectance, and optical constant as a function of wavelength showed that the direct energy gap decreased from (2.

4-2.

34) eV by the gain of the thickness.