A new fault injection approach to study the impact of bit flips in the configuration of SRAM-based FPGAS
By: Ziyadah, Haytham; Ayoubi, Rafiq; Idriss, Tariq…[et al.]. The International Arab Journal of Information Technology. Vol. 8, no. 2 (Apr. 2011), pp.155-162, 8 p.
Subjects: Integrated circuits