Analysis of the soft error susceptibility and failure rate in logic circuits
By: al-Qurashi, Iman; al-Rumi, Mayy; al-Mukhaizim, Sobeeh. The International Arab Journal of Information Technology. Vol. 8, no. 4 (Oct. 2011), pp.388-396, 9 p.
Subjects: Computers; Digital electronics; Electronic circuits; Microelectronics; Integrated circuits