![](/images/graphics-bg.png)
Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM
المؤلفون المشاركون
المصدر
العدد
المجلد 2013، العدد 2013 (31 ديسمبر/كانون الأول 2013)، ص ص. 1-17، 17ص.
الناشر
Hindawi Publishing Corporation
تاريخ النشر
2013-10-05
دولة النشر
مصر
عدد الصفحات
17
التخصصات الرئيسية
الملخص EN
Charge storage nonvolatile memory (NVM) is one of the main driving forces in the evolution of IT handheld devices.
Technology scaling of charge storage NVM has always been the strategy to achieve higher density NVM with lower cost per bit in order to meet the persistent consumer demand for larger storage space.
However, conventional technology scaling of charge storage NVM has run into many critical reliability challenges related to fundamental device characteristics.
Therefore, further technology scaling has to be supplemented with novel approaches in order to surmount these reliability issues to achieve desired reliability performance.
This paper is focused on reviewing critical research findings on major reliability challenges and technical solutions to mitigate technology scaling challenges of charge storage NVM.
Most of these technical solutions are still in research phase while a few of them are more mature and ready for production phase.
Three of the mature technical solutions will be reviewed in detail, that is, tunnel oxide top/bottom nitridation, nanocrystal, and phase change memory (PCM).
Key advantages and reported reliability challenges of these approaches are thoroughly reviewed in this paper.
This paper will serve as a good reference to understand the future trend of innovative technical solutions to overcome the reliability challenges of charge storage NVM due to technology scaling.
نمط استشهاد جمعية علماء النفس الأمريكية (APA)
Lee, Meng Chuan& Wong, Hin Yong. 2013. Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM. Journal of Nanomaterials،Vol. 2013, no. 2013, pp.1-17.
https://search.emarefa.net/detail/BIM-1007350
نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)
Lee, Meng Chuan& Wong, Hin Yong. Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM. Journal of Nanomaterials No. 2013 (2013), pp.1-17.
https://search.emarefa.net/detail/BIM-1007350
نمط استشهاد الجمعية الطبية الأمريكية (AMA)
Lee, Meng Chuan& Wong, Hin Yong. Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM. Journal of Nanomaterials. 2013. Vol. 2013, no. 2013, pp.1-17.
https://search.emarefa.net/detail/BIM-1007350
نوع البيانات
مقالات
لغة النص
الإنجليزية
الملاحظات
Includes bibliographical references
رقم السجل
BIM-1007350
قاعدة معامل التأثير والاستشهادات المرجعية العربي "ارسيف Arcif"
أضخم قاعدة بيانات عربية للاستشهادات المرجعية للمجلات العلمية المحكمة الصادرة في العالم العربي
![](/images/ebook-kashef.png)
تقوم هذه الخدمة بالتحقق من التشابه أو الانتحال في الأبحاث والمقالات العلمية والأطروحات الجامعية والكتب والأبحاث باللغة العربية، وتحديد درجة التشابه أو أصالة الأعمال البحثية وحماية ملكيتها الفكرية. تعرف اكثر
![](/images/kashef-image.png)