Energy Dissipation and the High-Strain Rate Dynamic Response of Vertically Aligned Carbon Nanotube Ensembles Grown on Silicon Wafer Substrate

الملخص EN

The dynamic mechanical behavior and high-strain rate response characteristics of a functionally graded material (FGM) system consisting of vertically aligned carbon nanotube ensembles grown on silicon wafer substrate (VACNT-Si) are presented.

Flexural rigidity (storage modulus) and loss factor (damping) were measured with a dynamic mechanical analyzer in an oscillatory three-point bending mode.

It was found that the functionally graded VACNT-Si exhibited significantly higher damping without sacrificing flexural rigidity.

A Split-Hopkinson pressure bar (SHPB) was used for determining the system response under high-strain rate compressive loading.

Combination of a soft and flexible VACNT forest layer over the hard silicon substrate presented novel challenges for SHPB testing.

It was observed that VACNT-Si specimens showed a large increase in the specific energy absorption over a pure Si wafer.