Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models

المؤلفون المشاركون

Zhao, Chun
Tao, Jing
Werner, M.
Taylor, S.
Chalker, P. R.
Zhao, Ce Zhou

المصدر

Journal of Nanomaterials

العدد

المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-6، 6ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2012-01-18

دولة النشر

مصر

عدد الصفحات

6

التخصصات الرئيسية

الكيمياء
هندسة مدنية

الملخص EN

Cerium-doped hafnium oxides (CexHf1−xO2) and lanthanum-doped zirconium oxides (LaxZr1−xO2) were investigated.

The highest dielectric constants, k, were obtained from lightly doped oxides with an La content of x=0.09 and a Ce content of x=0.1, for which k-values of 33~40 were obtained.

The dielectric relaxation appears to be related to the size of crystal grains formed during annealing, which was dependent on the doping level.

The physical and mathematical models were used to analyze the relationship between k-values and frequencies.

The variations in the k-values up to megahertz frequencies for both CexHf1−xO2 and LaxZr1−xO2 are simulated based on the Curie-von Schweidler (CS) or Havriliak-Negami (HN) relationships.

Concerning the lightly doped CexHf1−xO2 and LaxZr1−xO2, the data extracted are best modeled by the HN law, while LaxZr1−xO2 with doping level from x=0.22 to 0.63 are best modelled based on the CS law.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Zhao, Chun& Zhao, Ce Zhou& Tao, Jing& Werner, M.& Taylor, S.& Chalker, P. R.. 2012. Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-6.
https://search.emarefa.net/detail/BIM-1029167

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Zhao, Chun…[et al.]. Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models. Journal of Nanomaterials No. 2012 (2012), pp.1-6.
https://search.emarefa.net/detail/BIM-1029167

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Zhao, Chun& Zhao, Ce Zhou& Tao, Jing& Werner, M.& Taylor, S.& Chalker, P. R.. Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-6.
https://search.emarefa.net/detail/BIM-1029167

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-1029167