Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices

المؤلفون المشاركون

Wang, Lei
Yang, CiHui
Wen, Jing
Gai, Shan

المصدر

Journal of Nanomaterials

العدد

المجلد 2014، العدد 2014 (31 ديسمبر/كانون الأول 2014)، ص ص. 1-10، 10ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2014-12-23

دولة النشر

مصر

عدد الصفحات

10

التخصصات الرئيسية

الكيمياء
هندسة مدنية

الملخص EN

Continuous dimensional scaling of the CMOS technology, along with its cost reduction, has rendered Flash memory as one of the most promising nonvolatile memory candidates during the last decade.

With the Flash memory technology inevitably approaching its fundamental limits, more advanced storage nanodevices, which can probably overcome the scaling limits of Flash memory, are being explored, bringing about a series of new paradigms such as FeRAM, MRAM, PCRAM, and ReRAM.

These devices have indeed exhibited better scaling capability than Flash memory while also facing their respective physical drawbacks.

The consequent tradeoffs therefore drive the information storage device technology towards further advancement; as a result, new types of nonvolatile memories, including carbon memory, Mott memory, macromolecular memory, and molecular memory have been proposed.

In this paper, the nanomaterials used for these four emerging types of memories and the physical principles behind the writing and reading methods in each case are discussed, along with their respective merits and drawbacks when compared with conventional nonvolatile memories.

The potential applications of each technology are also briefly assessed.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Wang, Lei& Yang, CiHui& Wen, Jing& Gai, Shan. 2014. Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices. Journal of Nanomaterials،Vol. 2014, no. 2014, pp.1-10.
https://search.emarefa.net/detail/BIM-1042037

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Wang, Lei…[et al.]. Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices. Journal of Nanomaterials No. 2014 (2014), pp.1-10.
https://search.emarefa.net/detail/BIM-1042037

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Wang, Lei& Yang, CiHui& Wen, Jing& Gai, Shan. Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices. Journal of Nanomaterials. 2014. Vol. 2014, no. 2014, pp.1-10.
https://search.emarefa.net/detail/BIM-1042037

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-1042037