DPFFs: C 2 MOS Direct Path Flip-Flops for Process-Resilient Ultradynamic Voltage Scaling

المؤلفون المشاركون

Kwon, Sungoh
Hwang, Myeong-Eun

المصدر

Journal of Electrical and Computer Engineering

العدد

المجلد 2016، العدد 2016 (31 ديسمبر/كانون الأول 2016)، ص ص. 1-10، 10ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2016-05-10

دولة النشر

مصر

عدد الصفحات

10

التخصصات الرئيسية

تكنولوجيا المعلومات وعلم الحاسوب

الملخص EN

We propose two master-slave flip-flops (FFs) that utilize the clocked CMOS ( C 2 MOS ) technique with an internal direct connection along the main signal propagation path between the master and slave latches and adopt an adaptive body bias technique to improve circuit robustness.

C 2 MOS structure improves the setup margin and robustness while providing full compatibility with the standard cell characterization flow.

Further, the direct path shortens the logic depth and thus speeds up signal propagation, which can be optimized for less power and smaller area.

Measurements from test circuits fabricated in 130 nm technology show that the proposed FF operates down to 60 mV, consuming 24.7 pW while improving the propagation delay, dynamic power, and leakage by 22%, 9%, and 13%, respectively, compared with conventional FFs at the iso-output-load condition.

The proposed FFs are integrated into an 8 × 8 FIR filter which successfully operates all the way down to 85 mV.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Hwang, Myeong-Eun& Kwon, Sungoh. 2016. DPFFs: C 2 MOS Direct Path Flip-Flops for Process-Resilient Ultradynamic Voltage Scaling. Journal of Electrical and Computer Engineering،Vol. 2016, no. 2016, pp.1-10.
https://search.emarefa.net/detail/BIM-1108488

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Hwang, Myeong-Eun& Kwon, Sungoh. DPFFs: C 2 MOS Direct Path Flip-Flops for Process-Resilient Ultradynamic Voltage Scaling. Journal of Electrical and Computer Engineering No. 2016 (2016), pp.1-10.
https://search.emarefa.net/detail/BIM-1108488

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Hwang, Myeong-Eun& Kwon, Sungoh. DPFFs: C 2 MOS Direct Path Flip-Flops for Process-Resilient Ultradynamic Voltage Scaling. Journal of Electrical and Computer Engineering. 2016. Vol. 2016, no. 2016, pp.1-10.
https://search.emarefa.net/detail/BIM-1108488

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-1108488