On the optimal design of step-stress partially accelerated life tests for the gompertz distribution with type-I censoring

الملخص EN

This paper studies simple time-step stress Partially Accelerated Life Tests (PALT).

It is assumed that the lifetimes of test units follow a two-parameter Gompertz distribution and are type-I censored.

Maximum Likelihood Estimates and asymptotic confidence intervals for model parameters are obtained.

Alsb, optimum test plans for simple time-step stress test are developed.

Finally, for illustration, simulation studies are carried out.

Key Words and Phrases: Reliability; Gompertz distribution; partial acceleration; step-stress test; maximum likelihood estimation; Fisher information matrix; generalized asymptotic variance; Newton-Raphson method; optimum test plan; type-I censoring; Monte Carlo simulation.