Characterization of ZnO film grown on different substrates using PLD

مقدم أطروحة جامعية

Yusuf, Afnan Kamal

مشرف أطروحة جامعية

Haydar, Adawiya Jumah

الجامعة

الجامعة التكنولوجية

الكلية

-

القسم الأكاديمي

قسم العلوم التطبيقية

دولة الجامعة

العراق

الدرجة العلمية

دكتوراه

تاريخ الدرجة العلمية

2010

الملخص الإنجليزي

The structural quality of material (substrate material) and optical properties (intensity and spectra! emission range) of semiconductor materials are usually improved.

The idea of this work was to carry out a basic characterization of the structural (by X-ray diffraction technique and scanning electron microscopy) and optical (UV-VfS transmit on, photoJiuninescerice and Z-scan measurements) properties of Nano-crystalline ZnO samples and find edification.

In this work, we designed and constructed the reactive pulsed laser deposition system consists of two part (the first part is the chamber deposition the second part is laser satiric).

Which is used to fabricate thin films with high quality? Using double- frequency Q-switching Nd: YAG laser beam (wavelength I064nm and 532nm, repetition rate 1- 6H* and the pulse duration 10ns>, to deposit the Lit films en Glass, Quartz and.

sapphire substrates.

Many growth parameters have been considered to specify the optimum condition, namely substrate temperature (Room Temperature - 500) "Cs oxygen pressure (5*10', SxlCT3) mbar, irradiation condition, laser wavelength {lQ*J4iijn and 532mn) and laser flue nee energy density f 0, 5, 1, f temperature in 40fl"r, by the X-ray patterns (XRD), the full width at half maim am (FWHM) of the (002) peaks of the ZnO films become narrower whiten the temperature more above 4WC whale the PWHMs of the peaks of (002) Of the films were as broad as about (0.2532*) when films are grown at 40O"C on sapphire substrate with smallest grain size than the films deposited arc the glass and quartz.

This indicates the superior crystal! Ninety of the films, also from the SEM image tike smallest grain size a: the substrate temperature 400°C.

The optical properties of the films were studied by UV-VI5 transmission and photoltiminescence spectra measurements.

The optical transmission results shows that the trailsjuission over than -90% which increases with the increase ng substrate-e temperature, while the optical band gap calculate of the films was 3.5eV at 4O0"C and the refractive index decreases 4i the substrate temperature increases from (1.5 - 2.07} at

In addition the Photoluminescence (PL) results indicates that the thin films fabricated at the optimized conditions show the strongest UV peak was found at (345nm) from ZnO films grown at (16J / cm2 and 400*0), This result is consistent with that the XRD investigation..

And broad band invisible region from 505nm to 545nrn were a so observed.

Also studied the effect of Cb background pressure UN the structure, crystal Unity orientation and optical properties of the tilt.

Completely c- axis orientation ZnO films are grown in low Oil pressure consists a small gram size and .smoother surface than at high O; pressure.

The quality of the ZnO films grown by the shorter wavelength laser (532nrn) was better rJian that of films grown by the longer wavelength (J064mm).

The incident fluency is.

Shove.

To be an erective parameter on me quality 01 me in films growth and the smallest grain size obtained at 1.

Q / 'cm2-was 25.31 nm.

Z-scan leehnitju-e was used to study the nonlinear optical properties, represented by the nonlinear refractive index and nonlinear absorption coefficients of Zaria thin films.

Z-wt experiment was performed, using a double frequency-Q- switching Nd : YAG laser pulses at two different apertures (closed and opened).

The re suits shows that the nonlinear refractive index direct])' proportions] 10 the input energy.

This indicate can be employed this fi into in waveguide laser system.

التخصصات الرئيسية

الفيزياء

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Yusuf, Afnan Kamal. (2010). Characterization of ZnO film grown on different substrates using PLD. (Doctoral dissertations Theses and Dissertations Master). University of Technology, Iraq
https://search.emarefa.net/detail/BIM-305339

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Yusuf, Afnan Kamal. Characterization of ZnO film grown on different substrates using PLD. (Doctoral dissertations Theses and Dissertations Master). University of Technology. (2010).
https://search.emarefa.net/detail/BIM-305339

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Yusuf, Afnan Kamal. (2010). Characterization of ZnO film grown on different substrates using PLD. (Doctoral dissertations Theses and Dissertations Master). University of Technology, Iraq
https://search.emarefa.net/detail/BIM-305339

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لغة النص

الإنجليزية

نوع البيانات

رسائل جامعية

رقم السجل

BIM-305339