Optical properties of ternary Se80-xTe20Gex thin films

الملخص EN

The present paper deals with prepared of ternary Se80-xTe20Gex system alloys and thin films.

The XRD analysis improved that the amorphous structure of alloys and thin films for ternary Se80-xTe20Gex (at x = 10 and 20at.

% Ge) which prepared by thermal evaporation techniques with thickness 250 nm.

The optical energy gap measurements show that the optical energy gap decreases with increasing of (Ge) content from (1.7 to 1.47 eV).

It is found that the optical constants, such as refractive index, extinction coefficient, real and imaginary dielectric constant are non-systematic with increasing of Ge contents and annealing temperatures.