Determination of the relative directions of YBCO HTS thin films with respect to ZrO2 single crystal substrate

الملخص EN

In this research a method is proposed to determine the direction of the axis of YBCO HTS (high temperature superconductor ) thin films epitaxially grown on ZrO2 single crystals, with respect to the directions of axis of crystals of ZrO2 of the substrate, using the data from Laue and osillating crystal methods.

.After making calculations on Laue and vibrating crystal difraction pictures by projecting them on computer screen, the lattice parameters was determined by drawing the reciprocal lattice picture.The angle between the YBCO and substrate crystals was found to be 45 degree.

This method can be equally applied to determine the direction of any epitaxially grown thin film with respect to the crystals of the substrate.