Density of thin films of cadmium sulfide by nuclear backscattering

الملخص EN

The density of thin vapor-deposited films of cadmium sulfide was determined by spectrophotometry combined with Rutherford backscattering spectrometry.

The density determined was 0.95 ± 7% of the bulk value for the CdS.

The Lorentz-Lorenz law, based upon the measured data on the index of refraction of the films, suggests a value of the density of the films close to the one obtained in the present work.