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GeSi Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements
المؤلفون المشاركون
Ulyanov, V. V.
Rodrigues, A. D.
Zahn, Dietrich R. T.
Milekhin, Alexander
Pchelyakov, O. P.
Chiquito, A. J.
Galzerani, J. C.
Nikiforov, A. I.
Zanelatto, G.
المصدر
Advances in Condensed Matter Physics
العدد
المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-7، 7ص.
الناشر
Hindawi Publishing Corporation
تاريخ النشر
2012-09-02
دولة النشر
مصر
عدد الصفحات
7
التخصصات الرئيسية
الملخص EN
Ge/Si heterostructures with Ge self-assembled quantum dots (SAQDs) grown at various temperatures by molecular beam epitaxy were investigated using resonant Raman spectroscopy and capacitance measurements.
The occurrence of quantum confinement effects was confirmed by both techniques.
For the structures grown at low temperatures (300−400°C), the SAQDs optical phonon wavenumbers decrease as the Raman excitation energy is increased; this is an evidence of the scattering sensitivity to the size of the SAQDs and to the inhomogeneity in their sizes.
However, the opposite behavior is observed for the SAQDs grown at higher temperatures, as a consequence of the competition between the phonon localization and internal mechanical stress effects.
The E1 electronic transition of the Ge in the SAQDs was found to be shifted towards higher energies as compared to bulk Ge, due to biaxial compressive stress and to the electronic confinement effect present in the structures.
The intermixing of Si atoms in the quantum dots was found to be much more significant for the sample grown at higher temperatures.
The capacitance measurements, besides confirming the existence of the dots in these structures, showed that the deepest Ge layers lose their 0D signature as the growth temperature increases.
نمط استشهاد جمعية علماء النفس الأمريكية (APA)
Rodrigues, A. D.& Chiquito, A. J.& Zanelatto, G.& Milekhin, Alexander& Nikiforov, A. I.& Ulyanov, V. V.…[et al.]. 2012. GeSi Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements. Advances in Condensed Matter Physics،Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-452001
نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)
Rodrigues, A. D.…[et al.]. GeSi Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements. Advances in Condensed Matter Physics No. 2012 (2012), pp.1-7.
https://search.emarefa.net/detail/BIM-452001
نمط استشهاد الجمعية الطبية الأمريكية (AMA)
Rodrigues, A. D.& Chiquito, A. J.& Zanelatto, G.& Milekhin, Alexander& Nikiforov, A. I.& Ulyanov, V. V.…[et al.]. GeSi Quantum Dots Superlattices Grown at Different Temperatures and Characterized by Raman Spectroscopy and Capacitance Measurements. Advances in Condensed Matter Physics. 2012. Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-452001
نوع البيانات
مقالات
لغة النص
الإنجليزية
الملاحظات
Includes bibliographical references
رقم السجل
BIM-452001
قاعدة معامل التأثير والاستشهادات المرجعية العربي "ارسيف Arcif"
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