Wide Range Temperature Sensors Based on One-Dimensional Photonic Crystal with a Single Defect

المؤلفون المشاركون

Ojha, S. P.
Kumar, Arun
Singh, Kh. S.
Bhargava, A.
Kumar, Vipin
Suthar, B.

المصدر

International Journal of Microwave Science and Technology

العدد

المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-5، 5ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2012-08-15

دولة النشر

مصر

عدد الصفحات

5

التخصصات الرئيسية

هندسة كهربائية

الملخص EN

Transmission characteristics of one-dimensional photonic crystal structure with a defect have been studied.

Transfer matrix method has been employed to find the transmission spectra of the proposed structure.

We consider a Si/air multilayer system and refractive index of Si layer has been taken as temperature dependent.

As the refractive index of Si layer is a function of temperature of medium, so the central wavelength of the defect mode is a function of temperature.

Variation in temperature causes the shifting of defect modes.

It is found that the average change or shift in central wavelength of defect modes is 0.064 nm/K.

This property can be exploited in the design of a temperature sensor.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Kumar, Arun& Kumar, Vipin& Suthar, B.& Bhargava, A.& Singh, Kh. S.& Ojha, S. P.. 2012. Wide Range Temperature Sensors Based on One-Dimensional Photonic Crystal with a Single Defect. International Journal of Microwave Science and Technology،Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-452532

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Kumar, Arun…[et al.]. Wide Range Temperature Sensors Based on One-Dimensional Photonic Crystal with a Single Defect. International Journal of Microwave Science and Technology No. 2012 (2012), pp.1-5.
https://search.emarefa.net/detail/BIM-452532

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Kumar, Arun& Kumar, Vipin& Suthar, B.& Bhargava, A.& Singh, Kh. S.& Ojha, S. P.. Wide Range Temperature Sensors Based on One-Dimensional Photonic Crystal with a Single Defect. International Journal of Microwave Science and Technology. 2012. Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-452532

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-452532