Determination of crystallite size and strain from the analysis of X-ray diffraction line broadening

الملخص EN

The Fourier method has been utilized to analyze broadened x- ray lines due to size and strain of a nickel electro deposited on a brass substrate.

The size of crystallites are found to be nearly isotropic in the directions fill] and [200] where as strain is greater in [200] than in [111] directions.