Structural, optical and dielectric properties of (SrTiO3)‎ thin film prepared by PLD technique

العناوين الأخرى

الخواص التركيبية، البصرية و العزلية لأغشية سترونتيوم تيتانيت المحضرة بتقنية الليزر النبضي

مقدم أطروحة جامعية

al-Rabii, Iman Muhammad Abd

مشرف أطروحة جامعية

Abd al-Majid, Inam Muhammad
Adim, Kazim Abd al-Wahid

أعضاء اللجنة

Humud, Hammad R.
Yahya, Khalid Z.
al-Haddad, Rad Muhammad Salih

الجامعة

جامعة بغداد

الكلية

كلية العلوم

القسم الأكاديمي

قسم الفيزياء

دولة الجامعة

العراق

الدرجة العلمية

ماجستير

تاريخ الدرجة العلمية

2013

الملخص الإنجليزي

The plasma parameters such as density and temperature were measured using Langmuir probe.

The effect of Ar pressures on plasma characterization include, electron temperature, electrons density and ions density ni.

It is found that electron temperature decreases with increasing pressure from (8 to 5) eV.

For the electrons density, it increases with increasing gas pressure.

The behavior of ions density is the same as that of electrons.

A prepared compound of SrTiO3 is synthesized in polycrystalline form, using the stoicometric mixture of metallic oxides as a started material by conventional ceramic technique.

X-ray diffraction analysis confirmed that the prepared powder of SrTiO3 has cubic structure.

Struntume Titanate was deposited on glass and silicon substrates.

Studying the effect of annealing temperature on the structure properties of the first type of substrate, it is clear that the increasing the annealing temperature can improve the crystallinity of SrTiO3 thin films.

The surface morphology of the deposits thin films were studied using Atomic force microscope (AFM), it is observed that the grain size increases with increasing the annealing temperature it also increases with thickness.

Transmittance curves of SrTiO3 films show that they have high transmittance within the wavelength range (300-800nm), which makes them suitable to be used as antireflection coating in this region.

The optical energy gap of SrTiO3 films were measured for different thicknesses and annealing temperatures.

It decreases with increasing the thickness and annealing temperature of the films.

The optical constants such as refractive index, extinction coefficient and dielectric constant were also calculated.

II D.C electrical properties for SrTiO3 films at constant frequency were measured.

The activation energy has been determined; it is observed that the SrTiO3 films have two activation energies within the thermal range (303-473) K.

The electrical conductivity decreases with increasing thickness and annealing temperature.

The behavior of (capacitance- Frequency) at different thicknesses was discussed.

It is noted that the dielectric constant decreases with increasing frequency for all films and the dielectric constant decreases with increasing thickness.

The C-V characteristics were studied for deposit films on silicon substrate at different thicknesses and annealing temperatures it shows, small variation in capacitance as a function of applied field.

التخصصات الرئيسية

الفيزياء

الموضوعات

• الخواص الضوئية
• أشباه الموصلات
• الإلكترونيات

عدد الصفحات

84

قائمة المحتويات

• APA
• MLA
• AMA

لغة النص

الإنجليزية

نوع البيانات

رسائل جامعية

رقم السجل

BIM-606915