The effect of extracted broad beam on target material

الملخص EN

A Broad beam ion source was used for extracting argon, oxygen and nitrogen ion beams by affecting negative voltage on extractor electrode and collector plate.

The ion source efficiency was obtained without and with negative extraction voltage.

Extracting argon ion beam used for prepared the surface of magnesium alloy AZ31 specimens and the surface roughness of the samples was obtained at different exposure times.

SEM, Scanning Electron Microscope and CCD Camera (Charged Coupled Device) pictures were used for show and study the surface morphology of the samples.

The surface roughness was obtained using surface roughness tester TR110.