Annealing temperature effect on the Structural and Optical properties of Pb(Zr0.7,Ti0.3)‎O3 thin film prepared by Pulsed Laser Deposition (PLD)‎

الملخص EN

Pb(Zrx,Ti1-x)O3 (PZT) powder was prepared via solid-state reaction and deposited on glass by Pulsed Laser Deposition (PLD).

X-ray diffraction (XRD) analysis carried out to investigate the phase structure, it was found that PZT thin films with x=0.7 are polycrystalline with many peaks, and the results of Atomic Force Microscopy (AFM) used to studied the samples topographic indicated the film have grain size around 100 nm decrease to around 70 nm after annealing to 723 K.

The optiical properties of PZT films with x=0.7 studied at RT and 723 K.

The absorbance and transmittance spectra have been registered in the wavelength range (390-1100) nm so as to examine the optical properties at vis-IR wavelengths.

It was investigated that the optical energy gap (Eg) increase when annealing temperature (Ta) increase.

An extinction coefficient, refractive index, real and imaginary dielectric constant were sensitive to the change in temperature.

Fourier Transform Infra-Red (FTIR) to know the identity and to study the vibrational frequencies between the bonds of atoms for synthesized (PZT) Nanoparticles which found stretching at (3477.66 cm-1) after annealing to 723 K.

the interferometer used to determine the thickness of the deposited film, it found of about 200 nm.