Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy
المؤلفون المشاركون
Mannan, Md. Abdul
Baba, Yuji
Sekiguchi, Tetsuhiro
Shimoyama, Iwao
Hirao, Norie
Nagano, Masamitsu
Noguchi, Hideyuki
المصدر
العدد
المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-9، 9ص.
الناشر
Hindawi Publishing Corporation
تاريخ النشر
2012-09-20
دولة النشر
مصر
عدد الصفحات
9
التخصصات الرئيسية
الملخص EN
Molecular orientations for thin films of one-dimensional silicon polymers grown by vacuum evaporation have been assigned by near-edge X-ray absorption fine structure (NEXAFS) using linearly polarized synchrotron radiation.
The polymer investigated was polydimethylsilane (PDMS) which is the simplest stable silicon polymer, and one of the candidate materials for one-dimensional molecular wire.
For PDMS films deposited on highly oriented pyrolytic graphite (HOPG), four resonance peaks have been identified in the Si K-edge NEXAFS spectra.
Among these peaks, the intensities of the two peaks lower-energy at 1842.0 eV and 1843.2 eV were found to be strongly polarization dependent.
The peaks are assigned to the resonance excitations from the Si 1s to σ∗ pyz and σ∗ px orbitals localized at the Si–C and Si–Si bonds, respectively.
Quantitative evaluation of the polarization dependence of the NEXAFS spectra revealed that the molecules are self-assembled on HOPG surface, and the backbones of the PDMS are oriented nearly parallel to the surface.
The observed orientation is opposite to the previously observed results for PDMS on the other surfaces such as oxide (indium tin oxide) and metal (polycrystalline copper).
The flat-lying feature of PDMS observed only on HOPG surface is attributed to the interaction between CH bonds in PDMS and π orbitals in HOPG surface.
نمط استشهاد جمعية علماء النفس الأمريكية (APA)
Mannan, Md. Abdul& Baba, Yuji& Sekiguchi, Tetsuhiro& Shimoyama, Iwao& Hirao, Norie& Nagano, Masamitsu…[et al.]. 2012. Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-9.
https://search.emarefa.net/detail/BIM-998204
نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)
Mannan, Md. Abdul…[et al.]. Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy. Journal of Nanomaterials No. 2012 (2012), pp.1-9.
https://search.emarefa.net/detail/BIM-998204
نمط استشهاد الجمعية الطبية الأمريكية (AMA)
Mannan, Md. Abdul& Baba, Yuji& Sekiguchi, Tetsuhiro& Shimoyama, Iwao& Hirao, Norie& Nagano, Masamitsu…[et al.]. Orientation of One-Dimensional Silicon Polymer Films Studied by X-Ray Absorption Spectroscopy. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-9.
https://search.emarefa.net/detail/BIM-998204
نوع البيانات
مقالات
لغة النص
الإنجليزية
الملاحظات
Includes bibliographical references
رقم السجل
BIM-998204
قاعدة معامل التأثير والاستشهادات المرجعية العربي "ارسيف Arcif"
أضخم قاعدة بيانات عربية للاستشهادات المرجعية للمجلات العلمية المحكمة الصادرة في العالم العربي
تقوم هذه الخدمة بالتحقق من التشابه أو الانتحال في الأبحاث والمقالات العلمية والأطروحات الجامعية والكتب والأبحاث باللغة العربية، وتحديد درجة التشابه أو أصالة الأعمال البحثية وحماية ملكيتها الفكرية. تعرف اكثر