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An investigation of reliability and life time prediction for power MOSFET using electronically and statistical technique
By: al-Naqib, Abd al-Khaliq Abd al-Jabbar Ali Ghalib; Badr, Munaf Fathi; Kazim, Abd al-Hasan Abd Allah. Engineering and Technology Journal. Vol. 31, no. 4 B (2013), pp.551-558, 8 p.