Optical and structure properties of Mgx Zn1_x O thin films by pulsed laser deposition

Abstract EN

-In this study, the optical and structure properties of Mgx Zn1.x O thin films is reported.

The Mgx Zn1.xO thin films were prepared on Glass substrates by Q-switch second harmonic Nd:YAG laser deposition technigue with wavelength of 532nm from a ZnO target mixed with Mg of (0-0.3) wt% , and the films deposited at temperature (250°C).

The optical properties were characterized by transmittance and absorption spectroscopy measurements.

For all the films the average transmission in the U.V (200-900) nm wavelength region was over 85% and the absorption edge shifted to a shorter wavelength as the magnesium concentration increased.

The optical energy gap of Mgx Zn1-x O thin films, measured from transmittance spectra could be controlled between (3.3eV and 4.2eV) by adjusting magnesium concentration.

X-ray diffraction was used to investigate the structure of the film.

The refractive index of hexagonal MgxZn1-xO thin films decreases with the Mg concentration increase, such as at the wavelength of (500nm) the refractive index decreases from 1.93 to 1.85 as x increase from 0.15 to 0.3.

The extinction coefficient and the complex dielectric constant were also investigate.