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Electrical Characterization of NanopolyanilinePorous Silicon Heterojunction at High Temperatures
Joint Authors
El-Zohary, Salah E.
Shenashen, M. A.
Allam, Nageh K.
Okamoto, T.
Haraguchi, M.
Source
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-03-03
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Abstract EN
Nanopolyaniline/p-type porous silicon (NPANI/PSi) heterojunction films were chemically fabricated via in situ polymerization.
The composition and morphology of the nanopolymer were confirmed using Fourier transform infrared, scanning electron microscopy, UV-visible, and transmission electron microscopy techniques.
The results indicated that the polymerization took place throughout the porous layer.
The I-V measurements, performed at different temperatures, enabled the calculation of ideality factor, barrier height, and series resistance of those films.
The obtained ideality factor showed a nonideal diode behavior.
The series resistance was found to decrease with increasing temperature.
American Psychological Association (APA)
El-Zohary, Salah E.& Shenashen, M. A.& Allam, Nageh K.& Okamoto, T.& Haraguchi, M.. 2013. Electrical Characterization of NanopolyanilinePorous Silicon Heterojunction at High Temperatures. Journal of Nanomaterials،Vol. 2013, no. 2013, pp.1-8.
https://search.emarefa.net/detail/BIM-1007957
Modern Language Association (MLA)
El-Zohary, Salah E.…[et al.]. Electrical Characterization of NanopolyanilinePorous Silicon Heterojunction at High Temperatures. Journal of Nanomaterials No. 2013 (2013), pp.1-8.
https://search.emarefa.net/detail/BIM-1007957
American Medical Association (AMA)
El-Zohary, Salah E.& Shenashen, M. A.& Allam, Nageh K.& Okamoto, T.& Haraguchi, M.. Electrical Characterization of NanopolyanilinePorous Silicon Heterojunction at High Temperatures. Journal of Nanomaterials. 2013. Vol. 2013, no. 2013, pp.1-8.
https://search.emarefa.net/detail/BIM-1007957
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1007957