A Systematic Approach for Calculating the Symbol Error Rate for the Entire Range of EbN0 above and below the Threshold Point for the CE-OFDM System

Abstract EN

Recently, the performance of the constant envelope OFDM (CE-OFDM) was analyzed in additive white Gaussian noise (AWGN) with the help of a closed-form approximated expression for the symbol error rate (SER).

This expression was obtained with the assumption of having a high carrier-to-noise ratio (CNR) which, in effect, linearized the phase demodulator (the phase demodulator was implemented with an arctangent calculator) and simplified the analysis.

Thus, this expression is not accurate for the lower range of CNR.

As a matter of fact, it was already observed that there is a threshold point from which the simulated SER result vanishes from the theoretically obtained expression.

In this paper, we present a systematic approach for calculating the SER without assuming having the high CNR case or using linearization techniques.

In other words, we derive the SER for the nonlinear case.

As a byproduct, we obtain a new closed-form approximated expression for the SER based on the Laplace integral method and the Edgeworth expansion.

Simulation results indicate that the simulated results and those obtained from the new derived expression are very close for the entire range of bit energy-to-noise density ratio (Eb/N0) above and below the threshold point.