Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
Joint Authors
Zhou, Jingyu
Yang, Chenglin
Ren, Xuelong
Tian, Shulin
Source
Computational Intelligence and Neuroscience
Issue
Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-11, 11 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2014-12-29
Country of Publication
Egypt
No. of Pages
11
Main Subjects
Abstract EN
This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT).
This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output responses of the DUT for fault classification and detection.
The novel ELM-based test generation algorithm proposed in this paper contains mainly three aspects of innovation.
Firstly, this algorithm saves time efficiently by classifying response space with ELM.
Secondly, this algorithm can avoid reduced test precision efficiently in case of reduction of the number of impulse-response samples.
Thirdly, a new process of test signal generator and a test structure in test generation algorithm are presented, and both of them are very simple.
Finally, the abovementioned improvement and functioning are confirmed in experiments.
American Psychological Association (APA)
Zhou, Jingyu& Tian, Shulin& Yang, Chenglin& Ren, Xuelong. 2014. Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine. Computational Intelligence and Neuroscience،Vol. 2014, no. 2014, pp.1-11.
https://search.emarefa.net/detail/BIM-1034655
Modern Language Association (MLA)
Zhou, Jingyu…[et al.]. Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine. Computational Intelligence and Neuroscience No. 2014 (2014), pp.1-11.
https://search.emarefa.net/detail/BIM-1034655
American Medical Association (AMA)
Zhou, Jingyu& Tian, Shulin& Yang, Chenglin& Ren, Xuelong. Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine. Computational Intelligence and Neuroscience. 2014. Vol. 2014, no. 2014, pp.1-11.
https://search.emarefa.net/detail/BIM-1034655
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1034655