Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device

Joint Authors

Hung, Shih-Lin
Lin, Tzu-Hsuan
Lu, Yung-Chi

Source

The Scientific World Journal

Issue

Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-13, 13 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2014-03-09

Country of Publication

Egypt

No. of Pages

13

Main Subjects

Medicine
Information Technology and Computer Science

Abstract EN

This study developed an integrated global-local approach for locating damage on building structures.

A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage.

Local damage is then identified using an electromechanical impedance- (EMI-) based damage detection method.

The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability.

The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame.

Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building.

American Psychological Association (APA)

Lin, Tzu-Hsuan& Lu, Yung-Chi& Hung, Shih-Lin. 2014. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. The Scientific World Journal،Vol. 2014, no. 2014, pp.1-13.
https://search.emarefa.net/detail/BIM-1050805

Modern Language Association (MLA)

Lin, Tzu-Hsuan…[et al.]. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. The Scientific World Journal No. 2014 (2014), pp.1-13.
https://search.emarefa.net/detail/BIM-1050805

American Medical Association (AMA)

Lin, Tzu-Hsuan& Lu, Yung-Chi& Hung, Shih-Lin. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. The Scientific World Journal. 2014. Vol. 2014, no. 2014, pp.1-13.
https://search.emarefa.net/detail/BIM-1050805

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-1050805