Model of Reversible Breakdown in HfO2 Based on Fractal Patterns
Joint Authors
Lorenzi, P.
Rao, R.
Romano, G.
Irrera, F.
Source
Advances in Condensed Matter Physics
Issue
Vol. 2015, Issue 2015 (31 Dec. 2015), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2015-01-22
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Abstract EN
We propose a model of the kinetics of reversible breakdown in metal-insulator-metal structures with afnia based on the growth of fractal patterns of defects when the insulator is subject to an external voltage.
The probability that a defect is (or is not) generated and the position where it is generated depend on the electric field distribution.
The new defect moves accordingly to fractal rules and attach to another defect in a tree branch.
When the two electrodes sandwiching the insulating film are connected a conductive filament is formed and the breakdown takes place.
The model is calibrated with experiments inducing metastable soft breakdown events in Pt/HfO2/Pt capacitors.
American Psychological Association (APA)
Lorenzi, P.& Rao, R.& Romano, G.& Irrera, F.. 2015. Model of Reversible Breakdown in HfO2 Based on Fractal Patterns. Advances in Condensed Matter Physics،Vol. 2015, no. 2015, pp.1-8.
https://search.emarefa.net/detail/BIM-1052223
Modern Language Association (MLA)
Lorenzi, P.…[et al.]. Model of Reversible Breakdown in HfO2 Based on Fractal Patterns. Advances in Condensed Matter Physics No. 2015 (2015), pp.1-8.
https://search.emarefa.net/detail/BIM-1052223
American Medical Association (AMA)
Lorenzi, P.& Rao, R.& Romano, G.& Irrera, F.. Model of Reversible Breakdown in HfO2 Based on Fractal Patterns. Advances in Condensed Matter Physics. 2015. Vol. 2015, no. 2015, pp.1-8.
https://search.emarefa.net/detail/BIM-1052223
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1052223