The Influence of Thermal Conditions on V2O5 Nanostructures Prepared by Sol-Gel Method

Abstract EN

This work presents the result of structure investigations of V2O5 nanorods grown from thin films and powders prepared by sol-gel method.

To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100°C to 600°C.

The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS).

The rod-like structure of V2O5 was obtained at 600°C on both quartz glass and silicon substrates and also from the bulk xerogel.

The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.