Ultrafast Probe of Carrier Diffusion and Nongeminate Processes in a Single CdSSe Nanowire
Joint Authors
Eldridge, Peter S.
Blake, Jolie C.
Gundlach, Lars
Source
Issue
Vol. 2015, Issue 2015 (31 Dec. 2015), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2015-03-12
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Abstract EN
We measure ultrafast carrier dynamics in a single CdSSe nanowire at different excitation fluences using an ultrafast Kerr-gated microscope.
The time-resolved emission exhibits a dependence on excitation fluence, with the onset of the emission varying on the picosecond time scale with increasing laser power.
By fitting the emission to a model for amplified spontaneous emission (ASE), we are able to extract the nonradiative carrier recombination lifetime and nongeminate recombination constant.
The extracted nongeminate recombination constant suggests that our measurement technique allows the access to the nondiffusion limited recombination regime in nanowires with low carrier mobility.
American Psychological Association (APA)
Eldridge, Peter S.& Blake, Jolie C.& Gundlach, Lars. 2015. Ultrafast Probe of Carrier Diffusion and Nongeminate Processes in a Single CdSSe Nanowire. Journal of Spectroscopy،Vol. 2015, no. 2015, pp.1-6.
https://search.emarefa.net/detail/BIM-1070312
Modern Language Association (MLA)
Eldridge, Peter S.…[et al.]. Ultrafast Probe of Carrier Diffusion and Nongeminate Processes in a Single CdSSe Nanowire. Journal of Spectroscopy No. 2015 (2015), pp.1-6.
https://search.emarefa.net/detail/BIM-1070312
American Medical Association (AMA)
Eldridge, Peter S.& Blake, Jolie C.& Gundlach, Lars. Ultrafast Probe of Carrier Diffusion and Nongeminate Processes in a Single CdSSe Nanowire. Journal of Spectroscopy. 2015. Vol. 2015, no. 2015, pp.1-6.
https://search.emarefa.net/detail/BIM-1070312
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1070312