Defect Detection and Localization of Nonlinear System Based on Particle Filter with an Adaptive Parametric Model

Abstract EN

A robust particle filter (PF) and its application to fault/defect detection of nonlinear system are investigated in this paper.

First, an adaptive parametric model is exploited as the observation model for a nonlinear system.

Second, by incorporating the parametric model, particle filter is employed to estimate more accurate hidden states for the nonlinear stochastic system.

Third, by formulating the problem of defect detection within the hypothesis testing framework, the statistical properties of the proposed testing are established.

Finally, experimental results demonstrate the effectiveness and robustness of the proposed detector on real defect detection and localization in images.