A Cell-Based Smoothed XFEM for Fracture in Piezoelectric Materials

Abstract EN

This paper presents a cell-based smoothed extended finite element method (CS-XFEM) to analyze fractures in piezoelectric materials.

The method, which combines the cell-based smoothed finite element method (CS-FEM) and the extended finite element method (XFEM), shows advantages of both methods.

The crack tip enrichment functions are specially derived to represent the characteristics of the displacement field and electric field around the crack tip in piezoelectric materials.

With the help of the smoothing technique, integrating the singular derivatives of the crack tip enrichment functions is avoided by transforming interior integration into boundary integration.

This is a significant advantage over XFEM.

Numerical examples are presented to highlight the accuracy of the proposed CS-XFEM with the analytical solutions and the XFEM results.