Influence of Temperature on Typical Texture Distribution in Primary Recrystallization Matrix of 3% Si CGO Silicon Steel

Abstract EN

OM (optical microscopy) and EBSD (electron backscatter diffraction) techniques were used to study microstructure and texture distribution during primary recrystallization under different intermediate annealing temperatures in CGO silicon steels.

The effect of intermediate annealing temperature on texture distribution in 3% Si electrical steel was analyzed.

The results indicate that the microstructure in primary recrystallization matrix of CGO silicon steel is comprised of equiaxed ferrite grains.

Mean grain size of primary recrystallization increases with the rising of intermediate annealing temperature.

γ-fiber texture is the dominant component in primary recrystallization matrix.

With higher intermediate annealing temperature, 111 121 texture and 111 110 texture increase and 111 121 texture is stronger than 111 110 texture.

Goss texture was observed to be decreased firstly and then increased.

The content of high angle grain boundaries in primary recrystallization matrix are affected by intermediate annealing temperature.

When intermediate annealing temperature is increased, high angle grain boundaries are increased firstly and then decreased.

Misorientation distribution in primary recrystallized matrix is affected by primary recrystallization annealing temperature either.

The content of high angle grain boundaries are increased owing to higher primary recrystallization annealing temperature, which can be a benefit to the abnormal growth of Goss grains in secondary recrystallization.