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Percutaneous Punctured Transcatheter Device Closure of Residual Shunt after Ventricular Septal Defect Repair
Joint Authors
Mo, Xuming
Qi, Jirong
Zuo, Weisong
Source
Issue
Vol. 2016, Issue 2016 (31 Dec. 2016), pp.1-3, 3 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2016-05-17
Country of Publication
Egypt
No. of Pages
3
Main Subjects
Abstract EN
Ventricular septal defects (VSDs) are estimated to account for 20 to 30% of all congenital heart defects (CHDs).
Although a residual shunt is the most common complication of VSD surgery, a second operation that applies the surgical repair method is very difficult because it can increase the possibility of uncontrolled bleeding and the severity of tissue adhesion.
Here, we present the first case of percutaneous punctured transcatheter device closure of a residual shunt after VSD repair as a novel method to further develop for the treatment of children with congenital heart disease.
American Psychological Association (APA)
Mo, Xuming& Qi, Jirong& Zuo, Weisong. 2016. Percutaneous Punctured Transcatheter Device Closure of Residual Shunt after Ventricular Septal Defect Repair. Case Reports in Cardiology،Vol. 2016, no. 2016, pp.1-3.
https://search.emarefa.net/detail/BIM-1100386
Modern Language Association (MLA)
Mo, Xuming…[et al.]. Percutaneous Punctured Transcatheter Device Closure of Residual Shunt after Ventricular Septal Defect Repair. Case Reports in Cardiology No. 2016 (2016), pp.1-3.
https://search.emarefa.net/detail/BIM-1100386
American Medical Association (AMA)
Mo, Xuming& Qi, Jirong& Zuo, Weisong. Percutaneous Punctured Transcatheter Device Closure of Residual Shunt after Ventricular Septal Defect Repair. Case Reports in Cardiology. 2016. Vol. 2016, no. 2016, pp.1-3.
https://search.emarefa.net/detail/BIM-1100386
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1100386