XPS Analysis of AuGeNiCleaved GaAs(110) Interface
Joint Authors
Ghita, R. V.
Negrila, C.
Lazarescu, Mihail Florin
Logofatu, Constantin
Cotirlan, Costel
Frumosu, Florica
Trupina, Lucian
Source
Issue
Vol. 2016, Issue 2016 (31 Dec. 2016), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2016-10-31
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Abstract EN
The depth composition of the thin layer alloy, AuGeNi, devoted to acting as an ohmic contact on n-GaAs(110) has been investigated by in situ XPS combined with Argon ion sputtering techniques.
The fresh cleaved surfaces, supposed to be free of oxygen, were usually deposited with a 200 nm metallic layer in high vacuum conditions (better than 10−7 torr), by thermal evaporation, and annealed at a 430–450° Celsius temperature for 5 minutes.
About 18 sessions of ion Ar surfaces etching and intermediate XPS measurements were performed in order to reveal the border of the metal/semiconductor interface.
The atomic concentrations of the chemical elements have been approximated.
Au4f, Ga3d, Ga2p, As3d, As2p, Ni2p3/2, Ge3d, O1s, and C1s spectral lines were recorded.
The Au, Ge, and Ni have a homogenous distribution while Ga and As tend to diffuse to the surface.
Oxygen is present in the first layers of the surface while carbon completely disappears after the second etching step.
The existence of an Au-Ga alloy was detected and XPS spectra show only metal Ni and Ge within the layer and at the interface.
We tried to perform a study about the depth chemical composition profile analysis of AuGeNi layer on cleaved n-GaAs(110) by X-Ray Photoelectron Spectroscopy (XPS) technique.
American Psychological Association (APA)
Negrila, C.& Lazarescu, Mihail Florin& Logofatu, Constantin& Cotirlan, Costel& Ghita, R. V.& Frumosu, Florica…[et al.]. 2016. XPS Analysis of AuGeNiCleaved GaAs(110) Interface. Journal of Nanomaterials،Vol. 2016, no. 2016, pp.1-6.
https://search.emarefa.net/detail/BIM-1109369
Modern Language Association (MLA)
Negrila, C.…[et al.]. XPS Analysis of AuGeNiCleaved GaAs(110) Interface. Journal of Nanomaterials No. 2016 (2016), pp.1-6.
https://search.emarefa.net/detail/BIM-1109369
American Medical Association (AMA)
Negrila, C.& Lazarescu, Mihail Florin& Logofatu, Constantin& Cotirlan, Costel& Ghita, R. V.& Frumosu, Florica…[et al.]. XPS Analysis of AuGeNiCleaved GaAs(110) Interface. Journal of Nanomaterials. 2016. Vol. 2016, no. 2016, pp.1-6.
https://search.emarefa.net/detail/BIM-1109369
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1109369