A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function

Joint Authors

Li, Fan
Yi, Ze-Long

Source

Mathematical Problems in Engineering

Issue

Vol. 2016, Issue 2016 (31 Dec. 2016), pp.1-13, 13 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2016-11-13

Country of Publication

Egypt

No. of Pages

13

Main Subjects

Civil Engineering

Abstract EN

Software reliability growth models (SRGMs) based on a nonhomogeneous Poisson process (NHPP) are widely used to describe the stochastic failure behavior and assess the reliability of software systems.

For these models, the testing-effort effect and the fault interdependency play significant roles.

Considering a power-law function of testing effort and the interdependency of multigeneration faults, we propose a modified SRGM to reconsider the reliability of open source software (OSS) systems and then to validate the model’s performance using several real-world data.

Our empirical experiments show that the model well fits the failure data and presents a high-level prediction capability.

We also formally examine the optimal policy of software release, considering both the testing cost and the reliability requirement.

By conducting sensitivity analysis, we find that if the testing-effort effect or the fault interdependency was ignored, the best time to release software would be seriously delayed and more resources would be misplaced in testing the software.

American Psychological Association (APA)

Li, Fan& Yi, Ze-Long. 2016. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering،Vol. 2016, no. 2016, pp.1-13.
https://search.emarefa.net/detail/BIM-1112836

Modern Language Association (MLA)

Li, Fan& Yi, Ze-Long. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering No. 2016 (2016), pp.1-13.
https://search.emarefa.net/detail/BIM-1112836

American Medical Association (AMA)

Li, Fan& Yi, Ze-Long. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering. 2016. Vol. 2016, no. 2016, pp.1-13.
https://search.emarefa.net/detail/BIM-1112836

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-1112836