![](/images/graphics-bg.png)
A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function
Joint Authors
Source
Mathematical Problems in Engineering
Issue
Vol. 2016, Issue 2016 (31 Dec. 2016), pp.1-13, 13 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2016-11-13
Country of Publication
Egypt
No. of Pages
13
Main Subjects
Abstract EN
Software reliability growth models (SRGMs) based on a nonhomogeneous Poisson process (NHPP) are widely used to describe the stochastic failure behavior and assess the reliability of software systems.
For these models, the testing-effort effect and the fault interdependency play significant roles.
Considering a power-law function of testing effort and the interdependency of multigeneration faults, we propose a modified SRGM to reconsider the reliability of open source software (OSS) systems and then to validate the model’s performance using several real-world data.
Our empirical experiments show that the model well fits the failure data and presents a high-level prediction capability.
We also formally examine the optimal policy of software release, considering both the testing cost and the reliability requirement.
By conducting sensitivity analysis, we find that if the testing-effort effect or the fault interdependency was ignored, the best time to release software would be seriously delayed and more resources would be misplaced in testing the software.
American Psychological Association (APA)
Li, Fan& Yi, Ze-Long. 2016. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering،Vol. 2016, no. 2016, pp.1-13.
https://search.emarefa.net/detail/BIM-1112836
Modern Language Association (MLA)
Li, Fan& Yi, Ze-Long. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering No. 2016 (2016), pp.1-13.
https://search.emarefa.net/detail/BIM-1112836
American Medical Association (AMA)
Li, Fan& Yi, Ze-Long. A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function. Mathematical Problems in Engineering. 2016. Vol. 2016, no. 2016, pp.1-13.
https://search.emarefa.net/detail/BIM-1112836
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1112836