Thickness Induced Line-Defect Reconfigurations in Thin Nematic Cell

Joint Authors

Ambrožič, Milan
Kralj, S.

Source

Advances in Condensed Matter Physics

Issue

Vol. 2019, Issue 2019 (31 Dec. 2019), pp.1-7, 7 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2019-03-04

Country of Publication

Egypt

No. of Pages

7

Main Subjects

Physics

Abstract EN

We studied the impact of the cell thickness on configurations of line disclinations within a plane-parallel nematic cell.

The Lebwohl-Lasher semimicroscopic approach was used and (meta)stable nematic configurations were calculated using Brownian molecular dynamics.

Defect patterns were enforced topologically via boundary conditions.

We imposed periodic circular nematic surface fields at each confining surface.

The resulting structures exhibit line defects which either connect the facing plates or remain confined within the layers near confining plates.

The first structure is stable in relatively thin cells and the latter one in thick cells.

We focused on structures at the threshold regime where both structures compete.

We demonstrated that “history” of samples could have strong impact on resulting nematic configurations.

American Psychological Association (APA)

Ambrožič, Milan& Kralj, S.. 2019. Thickness Induced Line-Defect Reconfigurations in Thin Nematic Cell. Advances in Condensed Matter Physics،Vol. 2019, no. 2019, pp.1-7.
https://search.emarefa.net/detail/BIM-1117669

Modern Language Association (MLA)

Ambrožič, Milan& Kralj, S.. Thickness Induced Line-Defect Reconfigurations in Thin Nematic Cell. Advances in Condensed Matter Physics No. 2019 (2019), pp.1-7.
https://search.emarefa.net/detail/BIM-1117669

American Medical Association (AMA)

Ambrožič, Milan& Kralj, S.. Thickness Induced Line-Defect Reconfigurations in Thin Nematic Cell. Advances in Condensed Matter Physics. 2019. Vol. 2019, no. 2019, pp.1-7.
https://search.emarefa.net/detail/BIM-1117669

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-1117669