Pattern Dynamics of Nonlocal Delay SI Epidemic Model with the Growth of the Susceptible following Logistic Mode
Joint Authors
Liang, Juan
Guo, Zun-Guang
Li, Jing
Li, Can
Yan, Yiwei
Source
Issue
Vol. 2020, Issue 2020 (31 Dec. 2020), pp.1-11, 11 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2020-07-26
Country of Publication
Egypt
No. of Pages
11
Main Subjects
Abstract EN
In this paper, we investigate pattern dynamics of a nonlocal delay SI epidemic model with the growth of susceptible population following logistic mode.
Applying the linear stability theory, the condition that the model generates Turing instability at the endemic steady state is analyzed; then, the exact Turing domain is found in the parameter space.
Additionally, numerical results show that the time delay has key effect on the spatial distribution of the infected, that is, time delay induces the system to generate stripe patterns with different spatial structures and affects the average density of the infected.
The numerical simulation is consistent with the theoretical results, which provides a reference for disease prevention and control.
American Psychological Association (APA)
Guo, Zun-Guang& Li, Jing& Li, Can& Liang, Juan& Yan, Yiwei. 2020. Pattern Dynamics of Nonlocal Delay SI Epidemic Model with the Growth of the Susceptible following Logistic Mode. Complexity،Vol. 2020, no. 2020, pp.1-11.
https://search.emarefa.net/detail/BIM-1145462
Modern Language Association (MLA)
Guo, Zun-Guang…[et al.]. Pattern Dynamics of Nonlocal Delay SI Epidemic Model with the Growth of the Susceptible following Logistic Mode. Complexity No. 2020 (2020), pp.1-11.
https://search.emarefa.net/detail/BIM-1145462
American Medical Association (AMA)
Guo, Zun-Guang& Li, Jing& Li, Can& Liang, Juan& Yan, Yiwei. Pattern Dynamics of Nonlocal Delay SI Epidemic Model with the Growth of the Susceptible following Logistic Mode. Complexity. 2020. Vol. 2020, no. 2020, pp.1-11.
https://search.emarefa.net/detail/BIM-1145462
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1145462