A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components
Joint Authors
Source
International Journal of Antennas and Propagation
Issue
Vol. 2017, Issue 2017 (31 Dec. 2017), pp.1-7, 7 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2017-05-14
Country of Publication
Egypt
No. of Pages
7
Main Subjects
Abstract EN
A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components.
Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction.
The measurement standards and fixture are designed based on these two calibration methods.
For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured.
The parasitic effects of the SMD capacitors are analyzed.
The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components.
American Psychological Association (APA)
Cao, Xin& Tang, Zongxi. 2017. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. International Journal of Antennas and Propagation،Vol. 2017, no. 2017, pp.1-7.
https://search.emarefa.net/detail/BIM-1159281
Modern Language Association (MLA)
Cao, Xin& Tang, Zongxi. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. International Journal of Antennas and Propagation No. 2017 (2017), pp.1-7.
https://search.emarefa.net/detail/BIM-1159281
American Medical Association (AMA)
Cao, Xin& Tang, Zongxi. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. International Journal of Antennas and Propagation. 2017. Vol. 2017, no. 2017, pp.1-7.
https://search.emarefa.net/detail/BIM-1159281
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1159281
