Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor
Author
Photoenergy, International Journal of
Source
International Journal of Photoenergy
Issue
Vol. 2020, Issue 2020 (31 Dec. 2020), pp.1-1, 1 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2020-11-28
Country of Publication
Egypt
No. of Pages
1
Main Subjects
Abstract EN
International Journal of Photoenergy has retracted the article titled “Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor” [1], as it is essentially identical in content with a previously published paper [2].
In particular, the article contains identical figures (namely Figures 4b, 5a, and 5b) with the above mentioned paper.
While in the earlier published paper, the figures described the Ru-complex attached to TiO2, the same figures have now been used in this article to describe the electron transfer between the Ru-complex and the SnO2 semiconductor.
American Psychological Association (APA)
Photoenergy, International Journal of. 2020. Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor. International Journal of Photoenergy،Vol. 2020, no. 2020, pp.1-1.
https://search.emarefa.net/detail/BIM-1173113
Modern Language Association (MLA)
Photoenergy, International Journal of. Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor. International Journal of Photoenergy No. 2020 (2020), pp.1-1.
https://search.emarefa.net/detail/BIM-1173113
American Medical Association (AMA)
Photoenergy, International Journal of. Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor. International Journal of Photoenergy. 2020. Vol. 2020, no. 2020, pp.1-1.
https://search.emarefa.net/detail/BIM-1173113
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1173113